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Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch.

By: Material type: TextTextLanguage: English Publisher: Upper Saddle River, N.J. Prentice Hall, cop. 1999Description: xxvii, 349 s. illISBN:
  • 0130848271
Subject(s): DDC classification:
  • 621.3815 22
Item type Current library Collection Call number Status Date due Barcode Item holds
Book Högskolan Väst Övre plan (3rd floor) Våning 3 621.3815 Crouch Available 20115736004E0
Total holds: 0

Härtill CD-ROM

Includes bibliographical references and index

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